Determination of the ductile to brittle transition and critical depth of cut in 6H-silicon carbide through flycutting

Jerry Jacob; John A. Patten; Biswarup Bhattacharya; Jeremiah A. Couey; Eric Russell Marsh

Determination of the ductile to brittle transition and critical depth of cut in 6H-silicon carbide through flycutting

Jerry Jacob, John A. Patten, Biswarup Bhattacharya, Jeremiah A. Couey, Eric Russell Marsh

Mechanical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English (US)
Title of host publication	Proceedings of the 20th Annual ASPE Meeting, ASPE 2005
State	Published - Dec 1 2005
Event	20th Annual Meeting of the American Society for Precision Engineering, ASPE 2005 - Norfolk, VA, United States Duration: Oct 9 2005 → Oct 14 2005

Publication series

Name	Proceedings of the 20th Annual ASPE Meeting, ASPE 2005

Other

Other	20th Annual Meeting of the American Society for Precision Engineering, ASPE 2005
Country/Territory	United States
City	Norfolk, VA
Period	10/9/05 → 10/14/05

All Science Journal Classification (ASJC) codes

Mechanical Engineering

Cite this

@inproceedings{b52157420b4a4953946d74d4e9abcfbb,

title = "Determination of the ductile to brittle transition and critical depth of cut in 6H-silicon carbide through flycutting",

author = "Jerry Jacob and Patten, {John A.} and Biswarup Bhattacharya and Couey, {Jeremiah A.} and Marsh, {Eric Russell}",

year = "2005",

month = dec,

day = "1",

language = "English (US)",

isbn = "1887706399",

series = "Proceedings of the 20th Annual ASPE Meeting, ASPE 2005",

booktitle = "Proceedings of the 20th Annual ASPE Meeting, ASPE 2005",

note = "20th Annual Meeting of the American Society for Precision Engineering, ASPE 2005 ; Conference date: 09-10-2005 Through 14-10-2005",

}

Jacob, J, Patten, JA, Bhattacharya, B, Couey, JA & Marsh, ER 2005, Determination of the ductile to brittle transition and critical depth of cut in 6H-silicon carbide through flycutting. in Proceedings of the 20th Annual ASPE Meeting, ASPE 2005. Proceedings of the 20th Annual ASPE Meeting, ASPE 2005, 20th Annual Meeting of the American Society for Precision Engineering, ASPE 2005, Norfolk, VA, United States, 10/9/05.

Determination of the ductile to brittle transition and critical depth of cut in 6H-silicon carbide through flycutting. / Jacob, Jerry; Patten, John A.; Bhattacharya, Biswarup et al.
Proceedings of the 20th Annual ASPE Meeting, ASPE 2005. 2005. (Proceedings of the 20th Annual ASPE Meeting, ASPE 2005).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Determination of the ductile to brittle transition and critical depth of cut in 6H-silicon carbide through flycutting

AU - Jacob, Jerry

AU - Patten, John A.

AU - Bhattacharya, Biswarup

AU - Couey, Jeremiah A.

AU - Marsh, Eric Russell

PY - 2005/12/1

Y1 - 2005/12/1

UR - http://www.scopus.com/inward/record.url?scp=84884874892&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84884874892&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:84884874892

SN - 1887706399

SN - 9781887706391

T3 - Proceedings of the 20th Annual ASPE Meeting, ASPE 2005

BT - Proceedings of the 20th Annual ASPE Meeting, ASPE 2005

T2 - 20th Annual Meeting of the American Society for Precision Engineering, ASPE 2005

Y2 - 9 October 2005 through 14 October 2005

ER -

Determination of the ductile to brittle transition and critical depth of cut in 6H-silicon carbide through flycutting

Publication series

Other

All Science Journal Classification (ASJC) codes

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Cite this