Determination of the stacking order of curved few-layered graphene systems

Takuya Hayashi; Hiroyuki Muramatsu; Daisuke Shimamoto; Kazunori Fujisawa; Tomohiro Tojo; Yoshitaka Muramoto; Takuya Yokomae; Toru Asaoka; Yoong Ahm Kim; Mauricio Terrones; Morinobu Endo

doi:10.1039/c2nr30883e

Determination of the stacking order of curved few-layered graphene systems

Takuya Hayashi, Hiroyuki Muramatsu, Daisuke Shimamoto, Kazunori Fujisawa, Tomohiro Tojo, Yoshitaka Muramoto, Takuya Yokomae, Toru Asaoka, Yoong Ahm Kim, Mauricio Terrones, Morinobu Endo

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5 Scopus citations

Abstract

We report a facile method to efficiently visualize the atomic carbon network of curved few-layered graphitic systems including folded bi-layer graphene, nanoribbon edges and multi-walled carbon nanotubes (straight and bent), via the processing of aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) images. This technique is also able to atomically resolve the structure of overlapping graphene layers with different orientations, thus enabling us to determine the stacking order of multiple graphene layers. To the best of our knowledge, we are the first to identify the stacking order of a misoriented 4-layer closed-edge graphene and a metal-semiconductor double-walled carbon nanotube junction.

Original language	English (US)
Pages (from-to)	6419-6424
Number of pages	6
Journal	Nanoscale
Volume	4
Issue number	20
DOIs	https://doi.org/10.1039/c2nr30883e
State	Published - Oct 21 2012

All Science Journal Classification (ASJC) codes

Materials Science(all)

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10.1039/c2nr30883e

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title = "Determination of the stacking order of curved few-layered graphene systems",

abstract = "We report a facile method to efficiently visualize the atomic carbon network of curved few-layered graphitic systems including folded bi-layer graphene, nanoribbon edges and multi-walled carbon nanotubes (straight and bent), via the processing of aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) images. This technique is also able to atomically resolve the structure of overlapping graphene layers with different orientations, thus enabling us to determine the stacking order of multiple graphene layers. To the best of our knowledge, we are the first to identify the stacking order of a misoriented 4-layer closed-edge graphene and a metal-semiconductor double-walled carbon nanotube junction.",

author = "Takuya Hayashi and Hiroyuki Muramatsu and Daisuke Shimamoto and Kazunori Fujisawa and Tomohiro Tojo and Yoshitaka Muramoto and Takuya Yokomae and Toru Asaoka and Kim, {Yoong Ahm} and Mauricio Terrones and Morinobu Endo",

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T1 - Determination of the stacking order of curved few-layered graphene systems

AU - Hayashi, Takuya

AU - Muramatsu, Hiroyuki

AU - Shimamoto, Daisuke

AU - Fujisawa, Kazunori

AU - Tojo, Tomohiro

AU - Muramoto, Yoshitaka

AU - Yokomae, Takuya

AU - Asaoka, Toru

AU - Kim, Yoong Ahm

AU - Terrones, Mauricio

AU - Endo, Morinobu

PY - 2012/10/21

Y1 - 2012/10/21

N2 - We report a facile method to efficiently visualize the atomic carbon network of curved few-layered graphitic systems including folded bi-layer graphene, nanoribbon edges and multi-walled carbon nanotubes (straight and bent), via the processing of aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) images. This technique is also able to atomically resolve the structure of overlapping graphene layers with different orientations, thus enabling us to determine the stacking order of multiple graphene layers. To the best of our knowledge, we are the first to identify the stacking order of a misoriented 4-layer closed-edge graphene and a metal-semiconductor double-walled carbon nanotube junction.

AB - We report a facile method to efficiently visualize the atomic carbon network of curved few-layered graphitic systems including folded bi-layer graphene, nanoribbon edges and multi-walled carbon nanotubes (straight and bent), via the processing of aberration-corrected high-resolution transmission electron microscopy (AC-HRTEM) images. This technique is also able to atomically resolve the structure of overlapping graphene layers with different orientations, thus enabling us to determine the stacking order of multiple graphene layers. To the best of our knowledge, we are the first to identify the stacking order of a misoriented 4-layer closed-edge graphene and a metal-semiconductor double-walled carbon nanotube junction.

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Determination of the stacking order of curved few-layered graphene systems

Abstract

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