Determining anisotropic slip system rate sensitivities of Ti-6Al-4V using high-energy X-ray diffraction microscopy
- Kenneth M. Peterson
- , Jun Sang Park
- , Peter Kenesei
- , Caleb W. Herr
- , Adam Pilchak
- , Matthew Kasemer
- , Darren C. Pagan
Research output: Contribution to journal › Article › peer-review
6
Link opens in a new tab
Scopus
citations