TY - GEN
T1 - Determining manufacture variation in loudspeakers through measurement of thiele/small parameters
AU - Laurin, Scott
AU - Reichard, Karl Martin
PY - 2008/12/1
Y1 - 2008/12/1
N2 - Thiele/Small parameters have become a standard for characterizing loudspeakers. Using fairly straightforward methods, the Thiele/Small parameters for twenty nominally identical loudspeakers were determined. The data were compiled to determine the manufacturing variations. Manufacturing tolerances can have a large impact on the variability and quality of loudspeakers produced. Generally, when more stringent tolerances are applied, there is less variation and drivers become more expensive. Now that the loudspeakers have been characterized, each one will be driven to failure. Some loudspeakers will be intentionally degraded to accelerate failures. The goal is to correlate variation in the Thiele/Small parameters with variation in speaker failure modes and operating life.
AB - Thiele/Small parameters have become a standard for characterizing loudspeakers. Using fairly straightforward methods, the Thiele/Small parameters for twenty nominally identical loudspeakers were determined. The data were compiled to determine the manufacturing variations. Manufacturing tolerances can have a large impact on the variability and quality of loudspeakers produced. Generally, when more stringent tolerances are applied, there is less variation and drivers become more expensive. Now that the loudspeakers have been characterized, each one will be driven to failure. Some loudspeakers will be intentionally degraded to accelerate failures. The goal is to correlate variation in the Thiele/Small parameters with variation in speaker failure modes and operating life.
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M3 - Conference contribution
AN - SCOPUS:84866510232
SN - 9781605607122
T3 - Audio Engineering Society - 125th Audio Engineering Society Convention 2008
SP - 854
EP - 857
BT - Audio Engineering Society - 125th Audio Engineering Society Convention 2008
T2 - 125th Audio Engineering Society Convention 2008
Y2 - 2 October 2008 through 5 October 2008
ER -