Development and experimental verification of a two-dimensional numerical model of piezoelectrically induced threshold voltage shifts in GaAs MESFET's.

Keyphrases

• Stress Field 100%
• Experimental Verification 100%
• Mechanical Stress 100%
• Two-dimensional numerical Model 100%
• GaAs MESFET 100%
• Piezoelectric Charges 100%
• Threshold Voltage Shift 100%
• Two-dimensional Nature 50%
• Finite Element Method 50%
• Charge Distribution 50%
• Modeling Method 50%
• Charge Density 50%
• Finite Element Simulation 50%
• Load Model 50%
• Simplifying Assumption 50%
• Device Structure 50%
• Mechanical Load 50%
• Threshold Voltage 50%
• Sub-micrometer 50%
• Device Processing 50%
• MESFET 50%
• Theoretical Aspects 50%
• Two-dimensional Finite Element 50%
• Analytical Investigation 50%
• Electrical Parameters 50%
• Load Method 50%

Engineering

• Gallium Arsenide 100%
• Two Dimensional 100%
• Numerical Model 100%
• Stress Field 66%
• Piezoelectric 66%
• Mechanical Stress 66%
• Finite Element Method 33%
• Charge Density 33%
• Finite Element Simulation 33%
• Load Model 33%
• Mechanical Load 33%
• Simplifying Assumption 33%
• Device Structure 33%
• Loadline 33%