Development of a low-temperature electro-mechanical testing device

Keyphrases

• Low Temperature 100%
• Testing Device 100%
• Mechanical Load 100%
• Room Temperature 50%
• Magnetic Field 50%
• Thermal Cycling 50%
• Tensile Test 50%
• Stress-strain 50%
• Electromechanical Behavior 50%
• Critical Current Measurement 50%
• Strain Sensitivity 50%
• High-temperature Superconductors 50%
• Fatigue Cycles 50%
• Transport Critical Current 50%
• Initial Stress 50%
• In Situ Transport 50%
• Lorentz Force 50%

Engineering

• Low-Temperature 100%
• Mechanical Load 100%
• Mechanical Testing 100%
• Magnetic Field 50%
• Room Temperature 50%
• Tensile Testing 50%
• Electromechanical Behavior 50%
• Current Measurement 50%
• Induced Load 50%
• Controlled Fatigue 50%
• Strain Sensitivity 50%
• Lorentz Force 50%

Material Science

• Conductor 100%
• Mechanical Testing 100%
• Tensile Testing 33%
• Thermal Cycling 33%
• High Temperature Superconductors 33%