TY - GEN
T1 - Development of high TC PMN-PZT piezoelectric single crystals by the solid-state crystal growth (SSCG) technique
AU - Lee, H. Y.
AU - Zhang, Shujun
AU - Shrout, Thomas R.
PY - 2008/12/1
Y1 - 2008/12/1
N2 - Single crystals in the ternary MPB PMNPZ-PT system with relatively high Tcs and Ecs were fabricated by the solid-state single crystal growth (SSCG) technique and their dielectric and piezoelectric properties characterized. The dc bias effect on TRT (or the application usage temperature range), the high field unipolar strain, and the strain fatigue behavior induced by a phase change were investigated. Compared to PMN-PT single crystals, the high TC/EC PMN-PZT single crystals (TRT=144°C and EC=4.6kV/cm) were found to exhibit a much wider usage range with respect to electric field as well as temperature, and thus are better candidates for application in transducers and actuators.
AB - Single crystals in the ternary MPB PMNPZ-PT system with relatively high Tcs and Ecs were fabricated by the solid-state single crystal growth (SSCG) technique and their dielectric and piezoelectric properties characterized. The dc bias effect on TRT (or the application usage temperature range), the high field unipolar strain, and the strain fatigue behavior induced by a phase change were investigated. Compared to PMN-PT single crystals, the high TC/EC PMN-PZT single crystals (TRT=144°C and EC=4.6kV/cm) were found to exhibit a much wider usage range with respect to electric field as well as temperature, and thus are better candidates for application in transducers and actuators.
UR - http://www.scopus.com/inward/record.url?scp=58149518418&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=58149518418&partnerID=8YFLogxK
U2 - 10.1109/ISAF.2008.4693824
DO - 10.1109/ISAF.2008.4693824
M3 - Conference contribution
AN - SCOPUS:58149518418
SN - 1424427444
SN - 9781424427444
T3 - IEEE International Symposium on Applications of Ferroelectrics
BT - 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
T2 - 17th IEEE International Symposium on the Applications of Ferroelectrics, ISAF 2008
Y2 - 23 February 2008 through 28 February 2008
ER -