Dielectric and transverse piezoelectric properties of sol-gel-derived (001) Pb[Yb1/2Nb1/2]O3-PbTiO3 epitaxial thin films

Q. F. Zhou; Q. Q. Zhang; T. Yoshimura; S. Trolier-McKinstry

doi:10.1063/1.1581366

Dielectric and transverse piezoelectric properties of sol-gel-derived (001) Pb[Yb_1/2Nb_1/2]O₃-PbTiO₃ epitaxial thin films

Q. F. Zhou, Q. Q. Zhang, T. Yoshimura, S. Trolier-McKinstry

Research output: Contribution to journal › Article › peer-review

20 Scopus citations

Abstract

The dielectric and transverse piezoelectric properties of sol-gel processed perovskite phase (001) of epitaxial thin films were investigated. Within the frequency range of 100 to 10000 Hz only slight variations were seen in the dielectric permittivity and dielectric loss measurements. The remanent polarization and transverse piezoelectric coefficient of the film were obtained as 37 μC/m² and -10.2 C/m², respectively.

Original language	English (US)
Pages (from-to)	4767-4769
Number of pages	3
Journal	Applied Physics Letters
Volume	82
Issue number	26
DOIs	https://doi.org/10.1063/1.1581366
State	Published - Jun 30 2003

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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abstract = "The dielectric and transverse piezoelectric properties of sol-gel processed perovskite phase (001) of epitaxial thin films were investigated. Within the frequency range of 100 to 10000 Hz only slight variations were seen in the dielectric permittivity and dielectric loss measurements. The remanent polarization and transverse piezoelectric coefficient of the film were obtained as 37 μC/m2 and -10.2 C/m2, respectively.",

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AU - Zhou, Q. F.

AU - Zhang, Q. Q.

AU - Yoshimura, T.

AU - Trolier-McKinstry, S.

PY - 2003/6/30

Y1 - 2003/6/30

N2 - The dielectric and transverse piezoelectric properties of sol-gel processed perovskite phase (001) of epitaxial thin films were investigated. Within the frequency range of 100 to 10000 Hz only slight variations were seen in the dielectric permittivity and dielectric loss measurements. The remanent polarization and transverse piezoelectric coefficient of the film were obtained as 37 μC/m2 and -10.2 C/m2, respectively.

AB - The dielectric and transverse piezoelectric properties of sol-gel processed perovskite phase (001) of epitaxial thin films were investigated. Within the frequency range of 100 to 10000 Hz only slight variations were seen in the dielectric permittivity and dielectric loss measurements. The remanent polarization and transverse piezoelectric coefficient of the film were obtained as 37 μC/m2 and -10.2 C/m2, respectively.

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Dielectric and transverse piezoelectric properties of sol-gel-derived (001) Pb[Yb_1/2Nb_1/2]O₃-PbTiO₃ epitaxial thin films

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