Dielectric, ferroelectric, and piezoelectric properties of (001) BiScO 3-PbTiO3 epitaxial films near the morphotropic phase boundary

Juan C. Nino; Susan Trolier-McKinstry

doi:10.1557/jmr.2004.0069

Dielectric, ferroelectric, and piezoelectric properties of (001) BiScO ₃-PbTiO₃ epitaxial films near the morphotropic phase boundary

Juan C. Nino
, Susan Trolier-McKinstry

Research output: Contribution to journal › Article › peer-review

34 Scopus citations

Abstract

The dielectric, ferroelectric, and piezoelectric properties of (001) BiScO₃-PbTiO₃ epitaxial films near the morphotropic phase boundary were investigated. Epitaxial films, 1-μm thick, were grown on (100) SrRuO₃/(100) LaAlO₃ substrates by pulsed laser deposition from a BiScO₃-PbTiO₃ (40/60) ceramic target. The films had room temperature dielectric constant of 850, tanδ = 0.08, and maximum dielectric constant of 5530 at 455°C. Well-saturated hysteresis loops with a remanent polarization of 42 μC/cm² and a coercive field of 75 kV/cm were observed. The effective transverse piezoelectric coefficient e _31,f was -12 C/m². This result is quite encouraging for sensor and actuator device development because the observed piezoelectric properties are as good as (001) oriented Pb(Zr,Ti)O₃ films (e _31,f ∼ -12 C/m²) while the transition temperature is 100°C higher.

Original language	English (US)
Pages (from-to)	568-572
Number of pages	5
Journal	Journal of Materials Research
Volume	19
Issue number	2
DOIs	https://doi.org/10.1557/jmr.2004.0069
State	Published - Feb 2004

All Science Journal Classification (ASJC) codes

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Access to Document

10.1557/jmr.2004.0069

Cite this

@article{ceb8c232e8dd464bae8b33c5d1da0dc9,

title = "Dielectric, ferroelectric, and piezoelectric properties of (001) BiScO 3-PbTiO3 epitaxial films near the morphotropic phase boundary",

abstract = "The dielectric, ferroelectric, and piezoelectric properties of (001) BiScO3-PbTiO3 epitaxial films near the morphotropic phase boundary were investigated. Epitaxial films, 1-μm thick, were grown on (100) SrRuO3/(100) LaAlO3 substrates by pulsed laser deposition from a BiScO3-PbTiO3 (40/60) ceramic target. The films had room temperature dielectric constant of 850, tanδ = 0.08, and maximum dielectric constant of 5530 at 455°C. Well-saturated hysteresis loops with a remanent polarization of 42 μC/cm2 and a coercive field of 75 kV/cm were observed. The effective transverse piezoelectric coefficient e 31,f was -12 C/m2. This result is quite encouraging for sensor and actuator device development because the observed piezoelectric properties are as good as (001) oriented Pb(Zr,Ti)O3 films (e 31,f ∼ -12 C/m2) while the transition temperature is 100°C higher.",

author = "Nino, \{Juan C.\} and Susan Trolier-McKinstry",

note = "Funding Information: The authors are grateful to Tom Shrout for synthesis of the ceramic target and Mark Angelone for the assistance in the EPMA characterization. Support for this work was provided by the Office of Naval Research, Northrop Grumman, and the National Science Foundation.",

year = "2004",

month = feb,

doi = "10.1557/jmr.2004.0069",

language = "English (US)",

volume = "19",

pages = "568--572",

journal = "Journal of Materials Research",

issn = "0884-2914",

publisher = "Springer International Publishing AG",

number = "2",

}

TY - JOUR

T1 - Dielectric, ferroelectric, and piezoelectric properties of (001) BiScO 3-PbTiO3 epitaxial films near the morphotropic phase boundary

AU - Nino, Juan C.

AU - Trolier-McKinstry, Susan

N1 - Funding Information: The authors are grateful to Tom Shrout for synthesis of the ceramic target and Mark Angelone for the assistance in the EPMA characterization. Support for this work was provided by the Office of Naval Research, Northrop Grumman, and the National Science Foundation.

PY - 2004/2

Y1 - 2004/2

N2 - The dielectric, ferroelectric, and piezoelectric properties of (001) BiScO3-PbTiO3 epitaxial films near the morphotropic phase boundary were investigated. Epitaxial films, 1-μm thick, were grown on (100) SrRuO3/(100) LaAlO3 substrates by pulsed laser deposition from a BiScO3-PbTiO3 (40/60) ceramic target. The films had room temperature dielectric constant of 850, tanδ = 0.08, and maximum dielectric constant of 5530 at 455°C. Well-saturated hysteresis loops with a remanent polarization of 42 μC/cm2 and a coercive field of 75 kV/cm were observed. The effective transverse piezoelectric coefficient e 31,f was -12 C/m2. This result is quite encouraging for sensor and actuator device development because the observed piezoelectric properties are as good as (001) oriented Pb(Zr,Ti)O3 films (e 31,f ∼ -12 C/m2) while the transition temperature is 100°C higher.

AB - The dielectric, ferroelectric, and piezoelectric properties of (001) BiScO3-PbTiO3 epitaxial films near the morphotropic phase boundary were investigated. Epitaxial films, 1-μm thick, were grown on (100) SrRuO3/(100) LaAlO3 substrates by pulsed laser deposition from a BiScO3-PbTiO3 (40/60) ceramic target. The films had room temperature dielectric constant of 850, tanδ = 0.08, and maximum dielectric constant of 5530 at 455°C. Well-saturated hysteresis loops with a remanent polarization of 42 μC/cm2 and a coercive field of 75 kV/cm were observed. The effective transverse piezoelectric coefficient e 31,f was -12 C/m2. This result is quite encouraging for sensor and actuator device development because the observed piezoelectric properties are as good as (001) oriented Pb(Zr,Ti)O3 films (e 31,f ∼ -12 C/m2) while the transition temperature is 100°C higher.

UR - https://www.scopus.com/pages/publications/1842665180

UR - https://www.scopus.com/pages/publications/1842665180#tab=citedBy

U2 - 10.1557/jmr.2004.0069

DO - 10.1557/jmr.2004.0069

M3 - Article

AN - SCOPUS:1842665180

SN - 0884-2914

VL - 19

SP - 568

EP - 572

JO - Journal of Materials Research

JF - Journal of Materials Research

IS - 2

ER -

Dielectric, ferroelectric, and piezoelectric properties of (001) BiScO ₃-PbTiO₃ epitaxial films near the morphotropic phase boundary

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this