Dielectric functions of common ybco substrate materials determined by spectroscopic ellipsometry

Brady J. Gibbons; Susan Trolier-McKinstry

doi:10.1109/77.621025

Dielectric functions of common ybco substrate materials determined by spectroscopic ellipsometry

Brady J. Gibbons, Susan Trolier-McKinstry

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17 Scopus citations

Abstract

Reference dielectric function data for several common YBa₂Cu₃O_7-δ (YBCO) substrate materials have been determined by spectroscopic ellipsometry over the range 250 nm - 750 nm. These materials include LaAlO₃, BaZrO₃, NdGaO₃, 9.5 mol% Y₂O₃-ZrO₂ (YSZ), LaSrGaO₄ (LSGO), and (LaAlO₃)_0.3-(Sr₂AlTaO₆) _0.7 (LSAT). The precision of the data was confirmed by comparing SE determined data for SrTiO₃ to published values. Agreement to the third decimal point was shown. These data have been used to characterize interfaces between YBCO and some of these materials by SE.

Original language	English (US)
Pages (from-to)	2177-2180
Number of pages	4
Journal	IEEE Transactions on Applied Superconductivity
Volume	7
Issue number	2 PART 2
DOIs	https://doi.org/10.1109/77.621025
State	Published - 1997

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

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title = "Dielectric functions of common ybco substrate materials determined by spectroscopic ellipsometry",

abstract = "Reference dielectric function data for several common YBa2Cu3O7-δ (YBCO) substrate materials have been determined by spectroscopic ellipsometry over the range 250 nm - 750 nm. These materials include LaAlO3, BaZrO3, NdGaO3, 9.5 mol% Y2O3-ZrO2 (YSZ), LaSrGaO4 (LSGO), and (LaAlO3)0.3-(Sr2AlTaO6) 0.7 (LSAT). The precision of the data was confirmed by comparing SE determined data for SrTiO3 to published values. Agreement to the third decimal point was shown. These data have been used to characterize interfaces between YBCO and some of these materials by SE.",

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T1 - Dielectric functions of common ybco substrate materials determined by spectroscopic ellipsometry

AU - Gibbons, Brady J.

AU - Trolier-McKinstry, Susan

PY - 1997

Y1 - 1997

N2 - Reference dielectric function data for several common YBa2Cu3O7-δ (YBCO) substrate materials have been determined by spectroscopic ellipsometry over the range 250 nm - 750 nm. These materials include LaAlO3, BaZrO3, NdGaO3, 9.5 mol% Y2O3-ZrO2 (YSZ), LaSrGaO4 (LSGO), and (LaAlO3)0.3-(Sr2AlTaO6) 0.7 (LSAT). The precision of the data was confirmed by comparing SE determined data for SrTiO3 to published values. Agreement to the third decimal point was shown. These data have been used to characterize interfaces between YBCO and some of these materials by SE.

AB - Reference dielectric function data for several common YBa2Cu3O7-δ (YBCO) substrate materials have been determined by spectroscopic ellipsometry over the range 250 nm - 750 nm. These materials include LaAlO3, BaZrO3, NdGaO3, 9.5 mol% Y2O3-ZrO2 (YSZ), LaSrGaO4 (LSGO), and (LaAlO3)0.3-(Sr2AlTaO6) 0.7 (LSAT). The precision of the data was confirmed by comparing SE determined data for SrTiO3 to published values. Agreement to the third decimal point was shown. These data have been used to characterize interfaces between YBCO and some of these materials by SE.

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JF - IEEE Transactions on Applied Superconductivity

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Dielectric functions of common ybco substrate materials determined by spectroscopic ellipsometry

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