Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths

Kenneth E. Dudeck

Research output: Contribution to journalArticlepeer-review

22 Scopus citations


Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.

Original languageEnglish (US)
Pages (from-to)723-725
Number of pages3
JournalIEEE Transactions on Instrumentation and Measurement
Issue number5
StatePublished - Oct 1992

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Electrical and Electronic Engineering


Dive into the research topics of 'Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths'. Together they form a unique fingerprint.

Cite this