@article{7aca8a17f2d2494e8c48aaf8a2d5a938,
title = "Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths",
abstract = "Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.",
author = "Dudeck, {Kenneth E.}",
note = "Funding Information: Four thin-film polymers were used in the study. Polymethyl-methacrylate (Plexiglas, amorphous polymer), polyimide (Kap-ton), and polytetrafluoroethylene (Teflon) were used as received in Manuscript received June 19. 1991; revised April 6. 1992. This work was supported by the Naval Air Development Center. Warminhter. PA. through an ASEEiNavy Summer Fellowship. K. E. Dudeck is with the Pennsylvania State University, Hazleton Campus, Hazelton. PA 18201. L. J. Buckley is with the Naval Air Development Center. Warminqter. PA. IEEE Log Number 9202 I77",
year = "1992",
month = oct,
doi = "10.1109/19.177352",
language = "English (US)",
volume = "41",
pages = "723--725",
journal = "IEEE Transactions on Instrumentation and Measurement",
issn = "0018-9456",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "5",
}