Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths

Kenneth E. Dudeck

doi:10.1109/19.177352

Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths

Kenneth E. Dudeck

Penn State Hazleton

Research output: Contribution to journal › Article › peer-review

24 Scopus citations

Abstract

Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.

Original language	English (US)
Pages (from-to)	723-725
Number of pages	3
Journal	IEEE Transactions on Instrumentation and Measurement
Volume	41
Issue number	5
DOIs	https://doi.org/10.1109/19.177352
State	Published - Oct 1992

All Science Journal Classification (ASJC) codes

Instrumentation
Electrical and Electronic Engineering

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10.1109/19.177352

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title = "Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths",

abstract = "Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.",

author = "Dudeck, \{Kenneth E.\}",

note = "Funding Information: Four thin-film polymers were used in the study. Polymethyl-methacrylate (Plexiglas, amorphous polymer), polyimide (Kap-ton), and polytetrafluoroethylene (Teflon) were used as received in Manuscript received June 19. 1991; revised April 6. 1992. This work was supported by the Naval Air Development Center. Warminhter. PA. through an ASEEiNavy Summer Fellowship. K. E. Dudeck is with the Pennsylvania State University, Hazleton Campus, Hazelton. PA 18201. L. J. Buckley is with the Naval Air Development Center. Warminqter. PA. IEEE Log Number 9202 I77",

year = "1992",

month = oct,

doi = "10.1109/19.177352",

language = "English (US)",

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pages = "723--725",

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T1 - Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths

AU - Dudeck, Kenneth E.

N1 - Funding Information: Four thin-film polymers were used in the study. Polymethyl-methacrylate (Plexiglas, amorphous polymer), polyimide (Kap-ton), and polytetrafluoroethylene (Teflon) were used as received in Manuscript received June 19. 1991; revised April 6. 1992. This work was supported by the Naval Air Development Center. Warminhter. PA. through an ASEEiNavy Summer Fellowship. K. E. Dudeck is with the Pennsylvania State University, Hazleton Campus, Hazelton. PA 18201. L. J. Buckley is with the Naval Air Development Center. Warminqter. PA. IEEE Log Number 9202 I77

PY - 1992/10

Y1 - 1992/10

N2 - Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.

AB - Complex permittivity and permeability measurements at millimeter wave frequencies of thin samples (0.12 to 1.0 mm) were obtained. The methodology and considerations for making automated waveguide material measurements of thin samples in the 26.5 to 40 GHz (R-Band) frequency range are described herein. Measurement results for various dielectric materials are included.

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JO - IEEE Transactions on Instrumentation and Measurement

JF - IEEE Transactions on Instrumentation and Measurement

IS - 5

ER -

Dielectric Material Measurement of Thin Samples at Millimeter Wavelengths

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