Dielectric properties and relaxation in (1-x)BiScO3-xBa(Mg1/3Nb2/3 )O3 solid solutions

Do Kyun Kwon; Clive A. Randall; Thomas R. Shrout; Michael T. Lanagan

doi:10.1111/j.1551-2916.2004.01088.x

Dielectric properties and relaxation in (1-x)BiScO₃-xBa(Mg_1/3Nb_2/3 )O₃ solid solutions

Do Kyun Kwon, Clive A. Randall, Thomas R. Shrout, Michael T. Lanagan

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

The dielectric properties and frequency dispersion associated with a dielectric relaxation were evaluated within the perovskite (1-x)BiScO₃-xBa(Mg_1/3Nb_2/3 O₃ solid solution systems (0.7 ≤ x ≤ 1). With increasing BiScO₃, the room-temperature dielectric permittivity at low frequency (100 Hz) increased up to 115 at x = 0.7, and a dielectric relaxation phenomenon was evident. Relaxation parameters were analyzed using several Arrhenius-type equations, and the microwave dielectric property measurement using rectangular wave-guide method enabled confirmation of the extrapolated value of the Arrhenius plot. The result of the microwave dielectric property measurement was also checked with J-function fitting based on the frequency-dependent Gaussian distribution of the associated dielectric loss data at low frequency.

Original language	English (US)
Pages (from-to)	1088-1092
Number of pages	5
Journal	Journal of the American Ceramic Society
Volume	87
Issue number	6
DOIs	https://doi.org/10.1111/j.1551-2916.2004.01088.x
State	Published - Jun 2004

All Science Journal Classification (ASJC) codes

Ceramics and Composites
Materials Chemistry

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10.1111/j.1551-2916.2004.01088.x

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title = "Dielectric properties and relaxation in (1-x)BiScO3-xBa(Mg1/3Nb2/3 )O3 solid solutions",

abstract = "The dielectric properties and frequency dispersion associated with a dielectric relaxation were evaluated within the perovskite (1-x)BiScO3-xBa(Mg1/3Nb2/3 O3 solid solution systems (0.7 ≤ x ≤ 1). With increasing BiScO3, the room-temperature dielectric permittivity at low frequency (100 Hz) increased up to 115 at x = 0.7, and a dielectric relaxation phenomenon was evident. Relaxation parameters were analyzed using several Arrhenius-type equations, and the microwave dielectric property measurement using rectangular wave-guide method enabled confirmation of the extrapolated value of the Arrhenius plot. The result of the microwave dielectric property measurement was also checked with J-function fitting based on the frequency-dependent Gaussian distribution of the associated dielectric loss data at low frequency.",

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T1 - Dielectric properties and relaxation in (1-x)BiScO3-xBa(Mg1/3Nb2/3 )O3 solid solutions

AU - Kwon, Do Kyun

AU - Randall, Clive A.

AU - Shrout, Thomas R.

AU - Lanagan, Michael T.

PY - 2004/6

Y1 - 2004/6

N2 - The dielectric properties and frequency dispersion associated with a dielectric relaxation were evaluated within the perovskite (1-x)BiScO3-xBa(Mg1/3Nb2/3 O3 solid solution systems (0.7 ≤ x ≤ 1). With increasing BiScO3, the room-temperature dielectric permittivity at low frequency (100 Hz) increased up to 115 at x = 0.7, and a dielectric relaxation phenomenon was evident. Relaxation parameters were analyzed using several Arrhenius-type equations, and the microwave dielectric property measurement using rectangular wave-guide method enabled confirmation of the extrapolated value of the Arrhenius plot. The result of the microwave dielectric property measurement was also checked with J-function fitting based on the frequency-dependent Gaussian distribution of the associated dielectric loss data at low frequency.

AB - The dielectric properties and frequency dispersion associated with a dielectric relaxation were evaluated within the perovskite (1-x)BiScO3-xBa(Mg1/3Nb2/3 O3 solid solution systems (0.7 ≤ x ≤ 1). With increasing BiScO3, the room-temperature dielectric permittivity at low frequency (100 Hz) increased up to 115 at x = 0.7, and a dielectric relaxation phenomenon was evident. Relaxation parameters were analyzed using several Arrhenius-type equations, and the microwave dielectric property measurement using rectangular wave-guide method enabled confirmation of the extrapolated value of the Arrhenius plot. The result of the microwave dielectric property measurement was also checked with J-function fitting based on the frequency-dependent Gaussian distribution of the associated dielectric loss data at low frequency.

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Dielectric properties and relaxation in (1-x)BiScO₃-xBa(Mg_1/3Nb_2/3 )O₃ solid solutions

Abstract

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