TY - JOUR
T1 - Dielectric Properties of Reduced Heterogeneous Silica-Titania Glasses
AU - Medina, Francelys A.
AU - Furman, Eugene
AU - Lanagan, Michael T.
PY - 2010/12
Y1 - 2010/12
N2 - We have studied the frequency and temperature dependences of the dielectric properties of a heterogeneous silica-titania (SiO2-TiO2) glass by ac impedance spectroscopy measurements in the temperature range 25-700°C and the frequency range 40-107Hz. The heterogeneous glass was prepared by the controlled heat treatment of a homogenous SiO2-TiO2 glass, containing ~7.5wt% TiO2, in a reducing atmosphere to create a microstructure consisting of many discrete particles of the rutile/anatase TiO2 phase dispersed in a homogeneous SiO2-rich glassy matrix. Unlike the homogeneous SiO2-TiO2 glass, which exhibited only one electrical/dielectric dispersion, presumably due to ion hopping, the heterogeneous glass material exhibited two distinct electrical responses in the impedance formalism. We attributed these contributions to the two-phase microstructure and explained the dielectric behavior in terms of the Maxwell-Wagner relaxation arising at the interfaces between the TiO2 crystals and the SiO2-rich matrix phase.
AB - We have studied the frequency and temperature dependences of the dielectric properties of a heterogeneous silica-titania (SiO2-TiO2) glass by ac impedance spectroscopy measurements in the temperature range 25-700°C and the frequency range 40-107Hz. The heterogeneous glass was prepared by the controlled heat treatment of a homogenous SiO2-TiO2 glass, containing ~7.5wt% TiO2, in a reducing atmosphere to create a microstructure consisting of many discrete particles of the rutile/anatase TiO2 phase dispersed in a homogeneous SiO2-rich glassy matrix. Unlike the homogeneous SiO2-TiO2 glass, which exhibited only one electrical/dielectric dispersion, presumably due to ion hopping, the heterogeneous glass material exhibited two distinct electrical responses in the impedance formalism. We attributed these contributions to the two-phase microstructure and explained the dielectric behavior in terms of the Maxwell-Wagner relaxation arising at the interfaces between the TiO2 crystals and the SiO2-rich matrix phase.
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U2 - 10.1111/j.2041-1294.2010.00033.x
DO - 10.1111/j.2041-1294.2010.00033.x
M3 - Article
AN - SCOPUS:84877703352
SN - 2041-1286
VL - 1
SP - 358
EP - 367
JO - International Journal of Applied Glass Science
JF - International Journal of Applied Glass Science
IS - 4
ER -