TY - GEN
T1 - DIGITAL TWIN VALIDATION WITH MULTI-EPOCH, MULTI-VARIATE OUTPUT DATA
AU - He, Linyun
AU - Rhodes-Leader, Luke
AU - Song, Eunhye
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - This paper studies validation of a simulation-based process digital twin (DT). We assume that at any point the DT is queried, the system state is recorded. Then, the DT simulator is initialized to match the system state and the simulations are run to predict the key performance indicators (KPIs) at the end of each time epoch of interest. Our validation question is if the distribution of the simulated KPIs matches that of the system KPIs at every epoch. Typically, these KPIs are multi-variate random vectors and non-identically distributed across epochs making it difficult to apply the existing validation methods. We devise a hypothesis test that compares the marginal and joint distributions of the KPI vectors, separately, by transforming the multi-epoch data to identically distributed observations. We empirically demonstrate that the test has good power when the system and the simulator sufficiently differ in distribution.
AB - This paper studies validation of a simulation-based process digital twin (DT). We assume that at any point the DT is queried, the system state is recorded. Then, the DT simulator is initialized to match the system state and the simulations are run to predict the key performance indicators (KPIs) at the end of each time epoch of interest. Our validation question is if the distribution of the simulated KPIs matches that of the system KPIs at every epoch. Typically, these KPIs are multi-variate random vectors and non-identically distributed across epochs making it difficult to apply the existing validation methods. We devise a hypothesis test that compares the marginal and joint distributions of the KPI vectors, separately, by transforming the multi-epoch data to identically distributed observations. We empirically demonstrate that the test has good power when the system and the simulator sufficiently differ in distribution.
UR - https://www.scopus.com/pages/publications/85217619556
UR - https://www.scopus.com/pages/publications/85217619556#tab=citedBy
U2 - 10.1109/WSC63780.2024.10838742
DO - 10.1109/WSC63780.2024.10838742
M3 - Conference contribution
AN - SCOPUS:85217619556
T3 - Proceedings - Winter Simulation Conference
SP - 347
EP - 358
BT - 2024 Winter Simulation Conference, WSC 2024
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2024 Winter Simulation Conference, WSC 2024
Y2 - 15 December 2024 through 18 December 2024
ER -