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Dive into the research topics of 'Direct experimental evidence linking silicon dangling bond defects to oxide leakage currents'. Together they form a unique fingerprint.- Sort by
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P. M. Lenahan, J. J. Mele, J. P. Campbell, A. Y. Kang, R. K. Lowry, D. Woodbury, S. T. Liu, R. Weimer
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution