Direct lattice parameter measurements using HAADF-STEM

Adedapo A. Oni, Xiahan Sang, Aakash Kumar, Selva V. Raju, Srikant Srinivasan, Susan Sinnott, Surendra Saxena, Krishna Rajan, James M. Lebeau

Research output: Contribution to journalConference articlepeer-review

Original languageEnglish (US)
Pages (from-to)1050-1051
Number of pages2
JournalMicroscopy and Microanalysis
Issue number3
StatePublished - Aug 1 2014
EventMicroscopy and Microanalysis 2014, M and M 2014 - Hartford, United States
Duration: Aug 3 2014Aug 7 2014

All Science Journal Classification (ASJC) codes

  • Instrumentation

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