Direct lattice parameter measurements using HAADF-STEM

Adedapo A. Oni; Xiahan Sang; Aakash Kumar; Selva V. Raju; Srikant Srinivasan; Susan Sinnott; Surendra Saxena; Krishna Rajan; James M. Lebeau

doi:10.1017/S1431927614006977

Direct lattice parameter measurements using HAADF-STEM

Adedapo A. Oni
, Xiahan Sang
, Aakash Kumar
, Selva V. Raju
, Srikant Srinivasan
, Susan Sinnott
, Surendra Saxena
, Krishna Rajan
, James M. Lebeau

Research output: Contribution to journal › Conference article › peer-review

Original language	English (US)
Pages (from-to)	1050-1051
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	20
Issue number	3
DOIs	https://doi.org/10.1017/S1431927614006977
State	Published - Aug 1 2014
Event	Microscopy and Microanalysis 2014, M and M 2014 - Hartford, United States Duration: Aug 3 2014 → Aug 7 2014

All Science Journal Classification (ASJC) codes

Instrumentation

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10.1017/S1431927614006977

Cite this

@article{8d36bd66ad424d6997cb920812cde7a8,

title = "Direct lattice parameter measurements using HAADF-STEM",

author = "Oni, \{Adedapo A.\} and Xiahan Sang and Aakash Kumar and Raju, \{Selva V.\} and Srikant Srinivasan and Susan Sinnott and Surendra Saxena and Krishna Rajan and Lebeau, \{James M.\}",

year = "2014",

month = aug,

day = "1",

doi = "10.1017/S1431927614006977",

language = "English (US)",

volume = "20",

pages = "1050--1051",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "3",

note = "Microscopy and Microanalysis 2014, M and M 2014 ; Conference date: 03-08-2014 Through 07-08-2014",

}

TY - JOUR

T1 - Direct lattice parameter measurements using HAADF-STEM

AU - Oni, Adedapo A.

AU - Sang, Xiahan

AU - Kumar, Aakash

AU - Raju, Selva V.

AU - Srinivasan, Srikant

AU - Sinnott, Susan

AU - Saxena, Surendra

AU - Rajan, Krishna

AU - Lebeau, James M.

PY - 2014/8/1

Y1 - 2014/8/1

UR - https://www.scopus.com/pages/publications/84927932944

UR - https://www.scopus.com/pages/publications/84927932944#tab=citedBy

U2 - 10.1017/S1431927614006977

DO - 10.1017/S1431927614006977

M3 - Conference article

AN - SCOPUS:84927932944

SN - 1431-9276

VL - 20

SP - 1050

EP - 1051

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 3

T2 - Microscopy and Microanalysis 2014, M and M 2014

Y2 - 3 August 2014 through 7 August 2014

ER -

Direct lattice parameter measurements using HAADF-STEM

All Science Journal Classification (ASJC) codes

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