Direct measurement of the counterion distribution within swollen polyelectrolyte films

Vivek M. Prabhu; Bryan D. Vogt; Wen Li Wu; Jack F. Douglas; Eric K. Lin; Sushil K. Satija; Dario L. Goldfarb; Hiroshi Ito

doi:10.1021/la050353h

Direct measurement of the counterion distribution within swollen polyelectrolyte films

Vivek M. Prabhu, Bryan D. Vogt, Wen Li Wu, Jack F. Douglas, Eric K. Lin, Sushil K. Satija, Dario L. Goldfarb, Hiroshi Ito

Chemical Engineering

Research output: Contribution to journal › Article › peer-review

31 Scopus citations

Abstract

The depth profile of the counterion concentration within thin polyelectrolyte films was measured in situ using contrast variant specular neutron reflectivity to characterize the initial swelling stage of the film dissolution. We find substantial counterion depletion near the substrate and enrichment near the periphery of the film extending into the solution. These observations challenge our understanding of the charge distribution in polyelectrolyte films and are important for understanding film dissolution in medical and technological applications.

Original language	English (US)
Pages (from-to)	6647-6650
Number of pages	4
Journal	Langmuir
Volume	21
Issue number	15
DOIs	https://doi.org/10.1021/la050353h
State	Published - Jul 19 2005

All Science Journal Classification (ASJC) codes

Materials Science(all)
Condensed Matter Physics
Surfaces and Interfaces
Spectroscopy
Electrochemistry

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10.1021/la050353h

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abstract = "The depth profile of the counterion concentration within thin polyelectrolyte films was measured in situ using contrast variant specular neutron reflectivity to characterize the initial swelling stage of the film dissolution. We find substantial counterion depletion near the substrate and enrichment near the periphery of the film extending into the solution. These observations challenge our understanding of the charge distribution in polyelectrolyte films and are important for understanding film dissolution in medical and technological applications.",

author = "Prabhu, {Vivek M.} and Vogt, {Bryan D.} and Wu, {Wen Li} and Douglas, {Jack F.} and Lin, {Eric K.} and Satija, {Sushil K.} and Goldfarb, {Dario L.} and Hiroshi Ito",

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AU - Prabhu, Vivek M.

AU - Vogt, Bryan D.

AU - Wu, Wen Li

AU - Douglas, Jack F.

AU - Lin, Eric K.

AU - Satija, Sushil K.

AU - Goldfarb, Dario L.

AU - Ito, Hiroshi

PY - 2005/7/19

Y1 - 2005/7/19

N2 - The depth profile of the counterion concentration within thin polyelectrolyte films was measured in situ using contrast variant specular neutron reflectivity to characterize the initial swelling stage of the film dissolution. We find substantial counterion depletion near the substrate and enrichment near the periphery of the film extending into the solution. These observations challenge our understanding of the charge distribution in polyelectrolyte films and are important for understanding film dissolution in medical and technological applications.

AB - The depth profile of the counterion concentration within thin polyelectrolyte films was measured in situ using contrast variant specular neutron reflectivity to characterize the initial swelling stage of the film dissolution. We find substantial counterion depletion near the substrate and enrichment near the periphery of the film extending into the solution. These observations challenge our understanding of the charge distribution in polyelectrolyte films and are important for understanding film dissolution in medical and technological applications.

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Direct measurement of the counterion distribution within swollen polyelectrolyte films

Abstract

All Science Journal Classification (ASJC) codes

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