Abstract
The depth profile of the counterion concentration within thin polyelectrolyte films was measured in situ using contrast variant specular neutron reflectivity to characterize the initial swelling stage of the film dissolution. We find substantial counterion depletion near the substrate and enrichment near the periphery of the film extending into the solution. These observations challenge our understanding of the charge distribution in polyelectrolyte films and are important for understanding film dissolution in medical and technological applications.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 6647-6650 |
| Number of pages | 4 |
| Journal | Langmuir |
| Volume | 21 |
| Issue number | 15 |
| DOIs | |
| State | Published - Jul 19 2005 |
All Science Journal Classification (ASJC) codes
- General Materials Science
- Condensed Matter Physics
- Surfaces and Interfaces
- Spectroscopy
- Electrochemistry
Fingerprint
Dive into the research topics of 'Direct measurement of the counterion distribution within swollen polyelectrolyte films'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver