Abstract
Direct measurement of the spin polarization (P) of the magnetic semiconductor Ga1-xMnxAs was carried out using Andreev reflection spectroscopy. The conductance spectra of high transparency junction showed an intrinsic value for P greater than 85%. Results showed an extreme sensitivity of the measured spin polarization to the nature and quality of the interface for the material.
Original language | English (US) |
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Pages (from-to) | 566021-566024 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 91 |
Issue number | 5 |
State | Published - Aug 1 2003 |
All Science Journal Classification (ASJC) codes
- General Physics and Astronomy