Direct measurements of exciton diffusion length limitations on organic solar cell performance

Derek R. Kozub; Kiarash Vakhshouri; Sameer Vajjala Kesava; Cheng Wang; Alexander Hexemer; Enrique D. Gomez

doi:10.1039/c2cc31925j

Direct measurements of exciton diffusion length limitations on organic solar cell performance

Derek R. Kozub
, Kiarash Vakhshouri
, Sameer Vajjala Kesava
, Cheng Wang
, Alexander Hexemer
, Enrique D. Gomez

Research output: Contribution to journal › Article › peer-review

42 Scopus citations

Abstract

Through a combination of X-ray scattering and energy-filtered electron microscopy, we have quantitatively examined the relationship between the mesostructure of the photoactive layer and device performance in PBTTT/PC₇₁BM solar cells. We can predict device performance from X-ray structural data through a simple morphological model which includes the exciton diffusion length.

Original language	English (US)
Pages (from-to)	5859-5861
Number of pages	3
Journal	Chemical Communications
Volume	48
Issue number	47
DOIs	https://doi.org/10.1039/c2cc31925j
State	Published - May 17 2012

All Science Journal Classification (ASJC) codes

Electronic, Optical and Magnetic Materials
General Chemistry
Ceramics and Composites
Metals and Alloys
Materials Chemistry
Surfaces, Coatings and Films
Catalysis

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10.1039/c2cc31925j

Cite this

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title = "Direct measurements of exciton diffusion length limitations on organic solar cell performance",

abstract = "Through a combination of X-ray scattering and energy-filtered electron microscopy, we have quantitatively examined the relationship between the mesostructure of the photoactive layer and device performance in PBTTT/PC71BM solar cells. We can predict device performance from X-ray structural data through a simple morphological model which includes the exciton diffusion length.",

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AU - Kozub, Derek R.

AU - Vakhshouri, Kiarash

AU - Kesava, Sameer Vajjala

AU - Wang, Cheng

AU - Hexemer, Alexander

AU - Gomez, Enrique D.

PY - 2012/5/17

Y1 - 2012/5/17

N2 - Through a combination of X-ray scattering and energy-filtered electron microscopy, we have quantitatively examined the relationship between the mesostructure of the photoactive layer and device performance in PBTTT/PC71BM solar cells. We can predict device performance from X-ray structural data through a simple morphological model which includes the exciton diffusion length.

AB - Through a combination of X-ray scattering and energy-filtered electron microscopy, we have quantitatively examined the relationship between the mesostructure of the photoactive layer and device performance in PBTTT/PC71BM solar cells. We can predict device performance from X-ray structural data through a simple morphological model which includes the exciton diffusion length.

UR - https://www.scopus.com/pages/publications/85033428339

UR - https://www.scopus.com/pages/publications/85033428339#tab=citedBy

U2 - 10.1039/c2cc31925j

DO - 10.1039/c2cc31925j

M3 - Article

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AN - SCOPUS:85033428339

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SP - 5859

EP - 5861

JO - Chemical Communications

JF - Chemical Communications

IS - 47

ER -

Direct measurements of exciton diffusion length limitations on organic solar cell performance

Abstract

All Science Journal Classification (ASJC) codes

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