Distance guided selection of the best base classifier in an ensemble with application to cervigram image segmentation

Wei Wang, Xiaolei Huang

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

We empirically evaluate a distance-guided learning method embedded in a multiple classifier system (MCS) for tissue segmentation in optical images of the uterine cervix. Instead of combining multiple base classifiers as in traditional ensemble methods, we propose a Bhattacharyya distance based metric for measuring the similarity in decision boundary shapes between a pair of statistical classifiers. By generating an ensemble of base classifiers trained independently on separate training images, we can use the distance metric to select those classifiers in the ensemble whose decision boundaries are similar to that of an unknown test image. In an extreme case, we select the base classifier with the most similar decision boundary to accomplish classification and segmentation on the test image. Our approach is novel in the way that the nearest neighbor is picked and effectively solves classification problems in which base classifiers with good overall performance are not easy to construct due to a large variation in the training examples. In our experiments, we applied our method and several popular ensemble methods to segmenting acetowhite regions in cervical images. The overall classification accuracy of the proposed method is significantly better than that of a single classifier learned using the entire training set, and is also superior to other ensemble methods including majority voting, STAPLE, Boosting and Bagging.

Original languageEnglish (US)
Title of host publication2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2009
PublisherIEEE Computer Society
Pages109-116
Number of pages8
ISBN (Print)9781424439911
DOIs
StatePublished - 2009
Event2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2009 - Miami, FL, United States
Duration: Jun 20 2009Jun 25 2009

Publication series

Name2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2009

Conference

Conference2009 IEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops, CVPR Workshops 2009
Country/TerritoryUnited States
CityMiami, FL
Period6/20/096/25/09

All Science Journal Classification (ASJC) codes

  • Computer Vision and Pattern Recognition
  • Biomedical Engineering

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