Domain imaging in ferroelectric thin films via channeling-contrast backscattered electron microscopy

Keyphrases

• Backscattered Electron Imaging 100%
• Ferroelectric Thin Film 100%
• Domain Walls 100%
• Domain Imaging 100%
• Channeling Contrast 100%
• Non-destructive 66%
• Grain Orientation 66%
• High-resolution 33%
• High Energy 33%
• Nanometer Scale 33%
• Backscattered Electrons 33%
• Transmission Electron Microscopy 33%
• Microsystems 33%
• Electrical Energy 33%
• Capacitor Structure 33%
• Ferroelectric Domain Walls 33%
• Thermal Energy 33%
• Capacitors 33%
• Domain Wall Motion 33%
• Domain Structure 33%
• Imaging Techniques 33%
• Material System 33%
• Piezoresponse Force Microscopy 33%
• Polarization Domain 33%
• Electron Backscatter Diffraction 33%
• Force Transmission 33%
• Ferroelectric Films 33%
• Mechanical Energy 33%
• Nanosystems 33%
• Polarization Orientation 33%
• Optical Energy 33%
• Ferroelastic Domain Structure 33%
• Domain Orientation 33%
• Non-destructive Method 33%
• Thermo-optic 33%
• Structure Change 33%
• Microscale Systems 33%
• Wall Spacing 33%
• Dynamic Domains 33%

Engineering

• Thin Films 100%
• Backscattered Electron 100%
• Domain Wall 100%
• Channelling 100%
• Domain Structure 40%
• Grain Orientation 40%
• High Resolution 20%
• Nanometre 20%
• Microscale 20%
• Nanoscale 20%
• Material System 20%
• Electrical Energy 20%
• Mechanical Energy 20%
• Destructive Method 20%

Material Science

• Electron Microscopy 100%
• Ferroelectric Thin Films 100%
• Domain Wall 100%
• Capacitor 40%
• Transmission Electron Microscopy 20%
• Scanning Electron Microscopy 20%
• Ferroelectric Film 20%
• Electron Backscatter Diffraction 20%