Domain wall motion across various grain boundaries in ferroelectric thin films

Daniel M. Marincel; Huairuo Zhang; Stephen Jesse; Alex Belianinov; Mahmut B. Okatan; Sergei V. Kalinin; W. Mark Rainforth; Ian M. Reaney; Clive A. Randall; Susan Trolier-Mckinstry

doi:10.1111/jace.13535

Domain wall motion across various grain boundaries in ferroelectric thin films

Daniel M. Marincel, Huairuo Zhang, Stephen Jesse, Alex Belianinov, Mahmut B. Okatan, Sergei V. Kalinin, W. Mark Rainforth, Ian M. Reaney, Clive A. Randall, Susan Trolier-Mckinstry

Research output: Contribution to journal › Article › peer-review

44 Scopus citations

Abstract

Domain wall movement at and near engineered 10°, 15°, and 24° tilt and 10° and 30° twist grain boundaries was measured by band excitation piezoresponse force microscopy for Pb(Zr,Ti)O₃ films with Zr/Ti ratio of 45/55 and 52/48. A minimum in nonlinear response was observed at the grain boundary for the highest angle twist and tilt grain boundaries, while a maximum in nonlinear response was observed at the 10° tilt grain boundaries. The observed nonlinear response was correlated with the domain configurations imaged in cross section by transmission electron microscopy.

Original language	English (US)
Pages (from-to)	1848-1857
Number of pages	10
Journal	Journal of the American Ceramic Society
Volume	98
Issue number	6
DOIs	https://doi.org/10.1111/jace.13535
State	Published - Jun 1 2015

All Science Journal Classification (ASJC) codes

Ceramics and Composites
Materials Chemistry

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title = "Domain wall motion across various grain boundaries in ferroelectric thin films",

abstract = "Domain wall movement at and near engineered 10°, 15°, and 24° tilt and 10° and 30° twist grain boundaries was measured by band excitation piezoresponse force microscopy for Pb(Zr,Ti)O3 films with Zr/Ti ratio of 45/55 and 52/48. A minimum in nonlinear response was observed at the grain boundary for the highest angle twist and tilt grain boundaries, while a maximum in nonlinear response was observed at the 10° tilt grain boundaries. The observed nonlinear response was correlated with the domain configurations imaged in cross section by transmission electron microscopy.",

author = "Marincel, {Daniel M.} and Huairuo Zhang and Stephen Jesse and Alex Belianinov and Okatan, {Mahmut B.} and Kalinin, {Sergei V.} and Rainforth, {W. Mark} and Reaney, {Ian M.} and Randall, {Clive A.} and Susan Trolier-Mckinstry",

note = "Publisher Copyright: {\textcopyright} 2015 The American Ceramic Society.",

year = "2015",

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doi = "10.1111/jace.13535",

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T1 - Domain wall motion across various grain boundaries in ferroelectric thin films

AU - Marincel, Daniel M.

AU - Zhang, Huairuo

AU - Jesse, Stephen

AU - Belianinov, Alex

AU - Okatan, Mahmut B.

AU - Kalinin, Sergei V.

AU - Rainforth, W. Mark

AU - Reaney, Ian M.

AU - Randall, Clive A.

AU - Trolier-Mckinstry, Susan

PY - 2015/6/1

Y1 - 2015/6/1

N2 - Domain wall movement at and near engineered 10°, 15°, and 24° tilt and 10° and 30° twist grain boundaries was measured by band excitation piezoresponse force microscopy for Pb(Zr,Ti)O3 films with Zr/Ti ratio of 45/55 and 52/48. A minimum in nonlinear response was observed at the grain boundary for the highest angle twist and tilt grain boundaries, while a maximum in nonlinear response was observed at the 10° tilt grain boundaries. The observed nonlinear response was correlated with the domain configurations imaged in cross section by transmission electron microscopy.

AB - Domain wall movement at and near engineered 10°, 15°, and 24° tilt and 10° and 30° twist grain boundaries was measured by band excitation piezoresponse force microscopy for Pb(Zr,Ti)O3 films with Zr/Ti ratio of 45/55 and 52/48. A minimum in nonlinear response was observed at the grain boundary for the highest angle twist and tilt grain boundaries, while a maximum in nonlinear response was observed at the 10° tilt grain boundaries. The observed nonlinear response was correlated with the domain configurations imaged in cross section by transmission electron microscopy.

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Domain wall motion across various grain boundaries in ferroelectric thin films

Abstract

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