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Domain wall motion across various grain boundaries in ferroelectric thin films

Research output: Contribution to journalArticlepeer-review

Abstract

Domain wall movement at and near engineered 10°, 15°, and 24° tilt and 10° and 30° twist grain boundaries was measured by band excitation piezoresponse force microscopy for Pb(Zr,Ti)O3 films with Zr/Ti ratio of 45/55 and 52/48. A minimum in nonlinear response was observed at the grain boundary for the highest angle twist and tilt grain boundaries, while a maximum in nonlinear response was observed at the 10° tilt grain boundaries. The observed nonlinear response was correlated with the domain configurations imaged in cross section by transmission electron microscopy.

Original languageEnglish (US)
Pages (from-to)1848-1857
Number of pages10
JournalJournal of the American Ceramic Society
Volume98
Issue number6
DOIs
StatePublished - Jun 1 2015

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Materials Chemistry

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