Abstract
With Von-Neumann computing struggling to match the energy-efficiency of biological systems, there is pressing need to explore alternative computing models. Recent experimental studies have revealed that Resistive Random Access Memory (RRAM) is promising alternative for DRAM. Resistive crossbar arrays possess many promising features that can not only enable high-density and low-power storage but also non Von-Neumann compute models. Most recent works focus on dot product operation with RRAM crossbar arrays, and therefore are not flexible to implement various logical functions. We propose a low-power dynamic computing in memory system which can implement various functions in Sum of Product (SOP) form in RRAM crossbar array architecture. We evaluate the proposed technique by performing simulation over wide range of MCNC benchmarks. Simulation results show 1.42X and 20X latency improvement as well as 2.6X and 12.6X power saving compared to static and MAGIC computing in memory methods.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings - 2018 IEEE 36th International Conference on Computer Design, ICCD 2018 |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 179-186 |
| Number of pages | 8 |
| ISBN (Electronic) | 9781538684771 |
| DOIs | |
| State | Published - Jan 16 2019 |
| Event | 36th International Conference on Computer Design, ICCD 2018 - Orlando, United States Duration: Oct 7 2018 → Oct 10 2018 |
Publication series
| Name | Proceedings - 2018 IEEE 36th International Conference on Computer Design, ICCD 2018 |
|---|
Conference
| Conference | 36th International Conference on Computer Design, ICCD 2018 |
|---|---|
| Country/Territory | United States |
| City | Orlando |
| Period | 10/7/18 → 10/10/18 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 7 Affordable and Clean Energy
All Science Journal Classification (ASJC) codes
- Computer Networks and Communications
- Hardware and Architecture
- Safety, Risk, Reliability and Quality
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