Dynamic STEM-EELS for single-atom and defect measurement during electron beam transformations

Keyphrases

• Microscopy Electron 100%
• Electron Beam 100%
• High-resolution Electron Energy Loss Spectroscopy (HREELS) 100%
• Scanning Transmission Electron Microscopy 100%
• Single Atom 100%
• Single Defect 100%
• Atomic Level 33%
• Material Properties 33%
• Dynamic Phenomena 33%
• Static Data 33%
• Transient State 33%
• Dynamic State 33%
• Atomic Structure 33%
• On the Fly 33%
• Defect Formation 33%
• Traditional Techniques 33%
• Defect Evolution 33%
• V Doping 33%
• Doped MoS2 33%
• Machine Learning-based Approach 33%
• Classical Machine Learning 33%

Material Science

• Electron Energy Loss Spectrometry 100%
• Scanning Transmission Electron Microscopy 100%
• Atomic Structure 33%
• Materials Property 33%