Abstract
We have studied the effect of damage induced by 2 MeV alpha particles on the critical temperature, Tc, and resistivity, ρ, of Mg B2 thin films. This technique allows defects to be controllably introduced into Mg B2 in small successive steps. Tc decreases linearly as the intragrain resistivity at 40 K increases, while the intergrain connectivity is not changed. Tc is ultimately reduced to less than 7 K and we see no evidence for a saturation of Tc at about 20 K, contrary to the predictions of the Tc of Mg B2 in the dirty limit of interband scattering.
Original language | English (US) |
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Article number | 012508 |
Pages (from-to) | 012508-1-012508-3 |
Journal | Applied Physics Letters |
Volume | 86 |
Issue number | 1 |
DOIs | |
State | Published - Jan 2005 |
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)