Abstract
The electromechanical properties of undoped PbZr0.52Ti0.48O3 (PZT 52/48) samples in a size range 0.7-14 μ were studied as a function of the grain size. Internal bias fields were found to have significant effects on the dielectric and piezoelectric behavior of the samples. Strains from domain reorientation caused hysteresis in the strain vs. polarization curves. It was necessary to filter out these contributions in order to study the variation in Q33, the average ceramic electrostriction coefficient, with grain size. Q33 varied from 2.44 m4/C2 at 14 μ to 2.04 m4/C2 at 0.7 μ. An apparent critical size of 2.4 μ was observed for Q33. The suppression of the maximum dielectric constant for PZT 52/48 at the Curie Temperature may be related to the changes in grain size through the electrostrictive effects of clamping stresses.
Original language | English (US) |
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Pages | 935-938 |
Number of pages | 4 |
State | Published - 1996 |
Event | Proceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2) - East Brunswick, NJ, USA Duration: Aug 18 1996 → Aug 21 1996 |
Other
Other | Proceedings of the 1996 10th IEEE International Symposium on Applications of Ferroelectrics, ISAF. Part 1 (of 2) |
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City | East Brunswick, NJ, USA |
Period | 8/18/96 → 8/21/96 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering