Effect of EBG structures for reducing noise in multi-layer PCBs for digital systems

Daehyun Chung, Tae Hong Kim, Chunghyun Ryu, Ege Engin, Madhavan Swaminathan, Joungho Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

Abstract

The effect of EBG structures in various noise source environments is investigated. In this paper a one-dimensional electromagnetic band gap structure (1D-EBG) has been used in the power/ground planes for isolating signal vias from noise sources. The 1D-EBG structure generates about -70dB isolation in the path between the noise source and the signal via structure, so as to minimize the coupling of the power/ground cavity noise into the signal lines. In the presence of EBG structures, the voltage noise and timing jitter are significantly reduced for periodic noise sources. However, for random noise sources, the voltage noise and timing jitter can increase in the presence of EBG structures. This paper quantifies this effect.

Original languageEnglish (US)
Title of host publicationElectrical Performance of Electronic Packaging, EPEP
Pages253-256
Number of pages4
DOIs
StatePublished - 2006
Event14th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP - Scottsdale, AZ, United States
Duration: Oct 23 2006Oct 25 2006

Publication series

NameElectrical Performance of Electronic Packaging, EPEP

Conference

Conference14th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP
Country/TerritoryUnited States
CityScottsdale, AZ
Period10/23/0610/25/06

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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