TY - GEN
T1 - Effect of electromechanical coupling on the Young's modulus of zinc oxide nanowires
AU - Desai, A. V.
AU - Haque, Md Amanul
PY - 2009
Y1 - 2009
N2 - The Young's modulus of zinc oxide nanowires was measured to be significantly lower than bulk zinc oxide, which cannot be explained within the framework of existing theories. We propose that the strong electromechanical coupling in piezoelectric materials, such as zinc oxide, influences the measured mechanical properties. The asymmetric wurtzite crystal structure and the ionic nature of the molecular bonding result in internal electric fields during straining of the zinc oxide nanowire, which in turn lead to reduction in the measured modulus. In case of flexural deformation, additional electromechanical coupling is present due to the flexoelectric effect.
AB - The Young's modulus of zinc oxide nanowires was measured to be significantly lower than bulk zinc oxide, which cannot be explained within the framework of existing theories. We propose that the strong electromechanical coupling in piezoelectric materials, such as zinc oxide, influences the measured mechanical properties. The asymmetric wurtzite crystal structure and the ionic nature of the molecular bonding result in internal electric fields during straining of the zinc oxide nanowire, which in turn lead to reduction in the measured modulus. In case of flexural deformation, additional electromechanical coupling is present due to the flexoelectric effect.
UR - https://www.scopus.com/pages/publications/69949167611
UR - https://www.scopus.com/pages/publications/69949167611#tab=citedBy
M3 - Conference contribution
AN - SCOPUS:69949167611
SN - 9780791843253
SN - 9780791843284
T3 - 2008 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC 2008
SP - 553
EP - 559
BT - 2008 Proceedings of the ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC 2008
T2 - 2008 ASME International Design Engineering Technical Conferences and Computers and Information in Engineering Conference, DETC 2008
Y2 - 3 August 2008 through 6 August 2008
ER -