@article{c58fe308340c428e882ac11e1ebe6fb6,
title = "Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates",
abstract = "The effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial Sr1+xTiO3+ δ films grown on DyScO3 substrates is reported. Direct comparisons between nominally stoichiometric and non-stoichiometric films have been performed through measurements of lattice parameters, temperature-dependent permittivities, second harmonic generation, and terahertz dielectric spectra. The nominally stoichiometric film shows dispersion-free low-frequency permittivity with a sharp maximum and pronounced soft mode behavior. Our results suggest that strained perfectly stoichiometric SrTiO 3 films should not show relaxor behavior and that relaxor behavior emerges from defect dipoles that arise from non-stoichiometry in the highly polarizable strained SrTiO3 matrix.",
author = "Lee, {Che Hui} and Volodymyr Skoromets and Biegalski, {Michael D.} and Shiming Lei and Ryan Haislmaier and Margitta Bernhagen and Reinhard Uecker and Xiaoxing Xi and Venkatraman Gopalan and Xavier Mart{\'i} and Stanislav Kamba and Petr Ku{\v z}el and Schlom, {Darrell G.}",
note = "Funding Information: The authors wish to thank P. Van{\v e}k for his experimental help. The work at Cornell was supported by the ARO (Grant No. W911NF-09-1-0415). The work at Penn State was supported by the National Science Foundation through the MRSEC program (Grant No. DMR-0820404 and DMR-1210588). A portion of research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy. The work at Prague was supported by the Czech Science Foundation (projects 202/12/1163 and 202/09/H041) and Czech-American project LH13048.",
year = "2013",
month = feb,
day = "25",
doi = "10.1063/1.4793649",
language = "English (US)",
volume = "102",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics",
number = "8",
}