Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates

Che Hui Lee; Volodymyr Skoromets; Michael D. Biegalski; Shiming Lei; Ryan Haislmaier; Margitta Bernhagen; Reinhard Uecker; Xiaoxing Xi; Venkatraman Gopalan; Xavier Martí; Stanislav Kamba; Petr Kužel; Darrell G. Schlom

doi:10.1063/1.4793649

Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO₃ thin films on DyScO₃ substrates

Che Hui Lee
, Volodymyr Skoromets
, Michael D. Biegalski
, Shiming Lei
, Ryan Haislmaier
, Margitta Bernhagen
, Reinhard Uecker
, Xiaoxing Xi
, Venkatraman Gopalan
, Xavier Martí
, Stanislav Kamba
, Petr Kužel
, Darrell G. Schlom

Research output: Contribution to journal › Article › peer-review

44 Scopus citations

Abstract

The effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial Sr_1+xTiO₃₊ _δ films grown on DyScO₃ substrates is reported. Direct comparisons between nominally stoichiometric and non-stoichiometric films have been performed through measurements of lattice parameters, temperature-dependent permittivities, second harmonic generation, and terahertz dielectric spectra. The nominally stoichiometric film shows dispersion-free low-frequency permittivity with a sharp maximum and pronounced soft mode behavior. Our results suggest that strained perfectly stoichiometric SrTiO ₃ films should not show relaxor behavior and that relaxor behavior emerges from defect dipoles that arise from non-stoichiometry in the highly polarizable strained SrTiO₃ matrix.

Original language	English (US)
Article number	082905
Journal	Applied Physics Letters
Volume	102
Issue number	8
DOIs	https://doi.org/10.1063/1.4793649
State	Published - Feb 25 2013

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

Access to Document

10.1063/1.4793649

Cite this

Lee, C. H., Skoromets, V., Biegalski, M. D., Lei, S., Haislmaier, R., Bernhagen, M., Uecker, R., Xi, X., Gopalan, V., Martí, X., Kamba, S., Kužel, P., & Schlom, D. G. (2013). Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO₃ thin films on DyScO₃ substrates. Applied Physics Letters, 102(8), Article 082905. https://doi.org/10.1063/1.4793649

@article{c58fe308340c428e882ac11e1ebe6fb6,

title = "Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates",

abstract = "The effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial Sr1+xTiO3+ δ films grown on DyScO3 substrates is reported. Direct comparisons between nominally stoichiometric and non-stoichiometric films have been performed through measurements of lattice parameters, temperature-dependent permittivities, second harmonic generation, and terahertz dielectric spectra. The nominally stoichiometric film shows dispersion-free low-frequency permittivity with a sharp maximum and pronounced soft mode behavior. Our results suggest that strained perfectly stoichiometric SrTiO 3 films should not show relaxor behavior and that relaxor behavior emerges from defect dipoles that arise from non-stoichiometry in the highly polarizable strained SrTiO3 matrix.",

author = "Lee, \{Che Hui\} and Volodymyr Skoromets and Biegalski, \{Michael D.\} and Shiming Lei and Ryan Haislmaier and Margitta Bernhagen and Reinhard Uecker and Xiaoxing Xi and Venkatraman Gopalan and Xavier Mart{\'i} and Stanislav Kamba and Petr Ku{\v z}el and Schlom, \{Darrell G.\}",

note = "Funding Information: The authors wish to thank P. Van{\v e}k for his experimental help. The work at Cornell was supported by the ARO (Grant No. W911NF-09-1-0415). The work at Penn State was supported by the National Science Foundation through the MRSEC program (Grant No. DMR-0820404 and DMR-1210588). A portion of research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy. The work at Prague was supported by the Czech Science Foundation (projects 202/12/1163 and 202/09/H041) and Czech-American project LH13048.",

year = "2013",

month = feb,

day = "25",

doi = "10.1063/1.4793649",

language = "English (US)",

volume = "102",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "8",

}

Lee, CH, Skoromets, V, Biegalski, MD, Lei, S, Haislmaier, R, Bernhagen, M, Uecker, R, Xi, X, Gopalan, V, Martí, X, Kamba, S, Kužel, P & Schlom, DG 2013, 'Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO₃ thin films on DyScO₃ substrates', Applied Physics Letters, vol. 102, no. 8, 082905. https://doi.org/10.1063/1.4793649

TY - JOUR

T1 - Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates

AU - Lee, Che Hui

AU - Skoromets, Volodymyr

AU - Biegalski, Michael D.

AU - Lei, Shiming

AU - Haislmaier, Ryan

AU - Bernhagen, Margitta

AU - Uecker, Reinhard

AU - Xi, Xiaoxing

AU - Gopalan, Venkatraman

AU - Martí, Xavier

AU - Kamba, Stanislav

AU - Kužel, Petr

AU - Schlom, Darrell G.

N1 - Funding Information: The authors wish to thank P. Vaněk for his experimental help. The work at Cornell was supported by the ARO (Grant No. W911NF-09-1-0415). The work at Penn State was supported by the National Science Foundation through the MRSEC program (Grant No. DMR-0820404 and DMR-1210588). A portion of research was conducted at the Center for Nanophase Materials Sciences, which is sponsored at Oak Ridge National Laboratory by the Scientific User Facilities Division, Office of Basic Energy Sciences, U.S. Department of Energy. The work at Prague was supported by the Czech Science Foundation (projects 202/12/1163 and 202/09/H041) and Czech-American project LH13048.

PY - 2013/2/25

Y1 - 2013/2/25

N2 - The effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial Sr1+xTiO3+ δ films grown on DyScO3 substrates is reported. Direct comparisons between nominally stoichiometric and non-stoichiometric films have been performed through measurements of lattice parameters, temperature-dependent permittivities, second harmonic generation, and terahertz dielectric spectra. The nominally stoichiometric film shows dispersion-free low-frequency permittivity with a sharp maximum and pronounced soft mode behavior. Our results suggest that strained perfectly stoichiometric SrTiO 3 films should not show relaxor behavior and that relaxor behavior emerges from defect dipoles that arise from non-stoichiometry in the highly polarizable strained SrTiO3 matrix.

AB - The effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial Sr1+xTiO3+ δ films grown on DyScO3 substrates is reported. Direct comparisons between nominally stoichiometric and non-stoichiometric films have been performed through measurements of lattice parameters, temperature-dependent permittivities, second harmonic generation, and terahertz dielectric spectra. The nominally stoichiometric film shows dispersion-free low-frequency permittivity with a sharp maximum and pronounced soft mode behavior. Our results suggest that strained perfectly stoichiometric SrTiO 3 films should not show relaxor behavior and that relaxor behavior emerges from defect dipoles that arise from non-stoichiometry in the highly polarizable strained SrTiO3 matrix.

UR - https://www.scopus.com/pages/publications/84874829334

UR - https://www.scopus.com/pages/publications/84874829334#tab=citedBy

U2 - 10.1063/1.4793649

DO - 10.1063/1.4793649

M3 - Article

AN - SCOPUS:84874829334

SN - 0003-6951

VL - 102

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 8

M1 - 082905

ER -

Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO₃ thin films on DyScO₃ substrates

Abstract

All Science Journal Classification (ASJC) codes

Access to Document

Other files and links

Fingerprint

Cite this