Effect of stoichiometry on the dielectric properties and soft mode behavior of strained epitaxial SrTiO3 thin films on DyScO3 substrates

Che Hui Lee, Volodymyr Skoromets, Michael D. Biegalski, Shiming Lei, Ryan Haislmaier, Margitta Bernhagen, Reinhard Uecker, Xiaoxing Xi, Venkatraman Gopalan, Xavier Martí, Stanislav Kamba, Petr Kužel, Darrell G. Schlom

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