Effect of system components on electrical and thermal characteristics for power delivery networks in 3D system integration

Jianyong Xie, Daehyun Chung, Madhavan Swaminathan, Michael Mcallister, Alina Deutsch, Lijun Jiang, Barry J. Rubin

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Abstract

In this paper, parameterized electrical-thermal co-analysis for power delivery networks (PDN) in 3D system integration is carried out. A 3D integrated system including glass-ceramic substrate, single and stacked dies, power delivery network, through-silicon vias (TSVs), controlled collapse chip connections (C4s), underfill material, and thermal interface material (TIM) is analyzed with several variable parameters. The analysis results show that temperature effects on DC IR drop can not be neglected. The TIM thermal conductivity, C4 density, stacking order of stacked dies, and voltage source location affect the final IR drop and hot spot temperature in the system.

Original languageEnglish (US)
Title of host publication2009 IEEE 18th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS '09
Pages113-116
Number of pages4
DOIs
StatePublished - 2009
Event2009 IEEE 18th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS '09 - Portland, OR, United States
Duration: Oct 19 2009Oct 21 2009

Publication series

Name2009 IEEE 18th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS '09

Conference

Conference2009 IEEE 18th Conference on Electrical Performance of Electronic Packaging and Systems, EPEPS '09
Country/TerritoryUnited States
CityPortland, OR
Period10/19/0910/21/09

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering

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