Effect of vacuum annealing on charge transport and trapping in a-Si 1-xCx:H/c-Si heterostructures

Y. V. Gomeniuk, S. O. Gordienko, A. N. Nazarov, A. V. Vasin, A. V. Rusavsky, V. G. Stepanov, V. S. Lysenko, D. Ballutaud, S. Ashok

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