Effects of cryogenic sample analysis on molecular depth profiles with TOF-secondary ion mass spectrometry

Keyphrases

• Arginine 100%
• Secondary Ion Mass Spectrometry 100%
• Depth Profile 100%
• Sample Analysis 100%
• Sample Temperature 66%
• Bombardment 66%
• Steady State 66%
• Yield Improvement 66%
• Amino Acids 33%
• Fold Increase 33%
• Drug Molecules 33%
• Lipids 33%
• Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS) 33%
• Room Temperature 33%
• Low Temperature 33%
• Biomaterials 33%
• Organic Matter 33%
• Cyclosporine 33%
• Spectral Changes 33%
• Polypeptide 33%
• Ion Bombardment 33%
• Molecular Ions 33%
• Ion Yield 33%
• Role of Water 33%
• C60+ 33%
• Damage Cross-section 33%
• 1,3-Dioleoyl-2-palmitoylglycerol 33%
• H Ions 33%
• Secondary Ion Yield 33%
• Molecular Profiling 33%

Chemistry

• Sample Treatment 100%
• Secondary Ion Mass Spectroscopy 100%
• Arginine 100%
• Time-of-Flight Secondary Ion Mass Spectrometry 33%
• Secondary Ion 33%
• Ambient Reaction Temperature 33%
• Amino Acid 33%
• Molecular Ion 33%
• Ion Bombardment 33%
• Astatine Ion 33%
• Biomaterial 33%
• Polypeptide 33%
• Phosphatidylcholine 33%