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Effects of nitrogen on the interface density of states distribution in 4H-SiC metal oxide semiconductor field effect transistors: Super-hyperfine interactions and near interface silicon vacancy energy levels

  • Mark A. Anders
  • , Patrick M. Lenahan
  • , Arthur H. Edwards
  • , Peter A. Schultz
  • , Renee M. Van Ginhoven

Research output: Contribution to journal › Article › peer-review

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