Effects of partial topology on fault diagnosis

Brett Holbert, Srikar Tati, Simone Silvestri, Thomas La Porta, Ananthram Swami

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

Network components may experience faults for a variety of reasons, but it may not be immediately obvious which component failed. Fault diagnosis algorithms are required to localize failures and thereby enable the recovery process. Most current state of the art fault diagnosis algorithms assume full knowledge of the network topology, which may not be available in real scenarios. In this paper we examine the performance of one of these fault diagnosis algorithms, namely Max-Coverage (MC), when the topology is only partially known. We introduce a simple extension, called the Virtual Topology (VT), to correctly identify faults when a failure occurs in an unobserved component. We compare the performance of MC under partial topology knowledge with and without this extension to show that VT significantly improves correct diagnosis, but at the cost of a high number of false positives. Moreover, we demonstrate that correctly inferring areas of the unobserved network substantially mitigates the drawbacks associated with using VT.

Original languageEnglish (US)
Title of host publicationProceedings - 2013 IEEE Military Communications Conference, MILCOM 2013
Pages725-730
Number of pages6
DOIs
StatePublished - 2013
Event2013 IEEE Military Communications Conference, MILCOM 2013 - San Diego, CA, United States
Duration: Nov 18 2013Nov 20 2013

Publication series

NameProceedings - IEEE Military Communications Conference MILCOM

Other

Other2013 IEEE Military Communications Conference, MILCOM 2013
Country/TerritoryUnited States
CitySan Diego, CA
Period11/18/1311/20/13

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Effects of partial topology on fault diagnosis'. Together they form a unique fingerprint.

Cite this