Efficient statistical analysis and diagnosis of high speed source synchronous interfaces

Erdem Matoglu; Madhavan Swaminathan; Nam Pham; Daniel N. De Araujo; Moises Cases

doi:10.1109/EPEP.2002.1057919

Efficient statistical analysis and diagnosis of high speed source synchronous interfaces

Erdem Matoglu, Madhavan Swaminathan, Nam Pham, Daniel N. De Araujo, Moises Cases

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

11 Scopus citations

Abstract

The jitter and voltage margin of a source synchronous memory bus has been analyzed under various physical and operational conditions. Using sensitivity functions derived through linearly independent experiments, the statistical distribution of the performance has been computed. The sensitivity functions have also been utilized as a diagnosis tool to estimate the design parameters required to meet the performance specifications.

Original language	English (US)
Title of host publication	Electrical Performance of Electronic Packaging, EPEP 2002
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	223-226
Number of pages	4
ISBN (Electronic)	0780374517
DOIs	https://doi.org/10.1109/EPEP.2002.1057919
State	Published - 2002
Event	11th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP 2002 - Monterey, United States Duration: Oct 21 2002 → Oct 23 2002

Publication series

Name	IEEE Topical Meeting on Electrical Performance of Electronic Packaging
Volume	2002-January

Conference

Conference	11th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP 2002
Country/Territory	United States
City	Monterey
Period	10/21/02 → 10/23/02

All Science Journal Classification (ASJC) codes

Electrical and Electronic Engineering
Condensed Matter Physics
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/EPEP.2002.1057919

Cite this

Matoglu, E., Swaminathan, M., Pham, N., De Araujo, D. N., & Cases, M. (2002). Efficient statistical analysis and diagnosis of high speed source synchronous interfaces. In Electrical Performance of Electronic Packaging, EPEP 2002 (pp. 223-226). Article 1057919 (IEEE Topical Meeting on Electrical Performance of Electronic Packaging; Vol. 2002-January). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/EPEP.2002.1057919

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title = "Efficient statistical analysis and diagnosis of high speed source synchronous interfaces",

abstract = "The jitter and voltage margin of a source synchronous memory bus has been analyzed under various physical and operational conditions. Using sensitivity functions derived through linearly independent experiments, the statistical distribution of the performance has been computed. The sensitivity functions have also been utilized as a diagnosis tool to estimate the design parameters required to meet the performance specifications.",

author = "Erdem Matoglu and Madhavan Swaminathan and Nam Pham and {De Araujo}, {Daniel N.} and Moises Cases",

note = "Publisher Copyright: {\textcopyright} 2012 IEEE.; 11th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP 2002 ; Conference date: 21-10-2002 Through 23-10-2002",

year = "2002",

doi = "10.1109/EPEP.2002.1057919",

language = "English (US)",

series = "IEEE Topical Meeting on Electrical Performance of Electronic Packaging",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

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booktitle = "Electrical Performance of Electronic Packaging, EPEP 2002",

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Matoglu, E, Swaminathan, M, Pham, N, De Araujo, DN & Cases, M 2002, Efficient statistical analysis and diagnosis of high speed source synchronous interfaces. in Electrical Performance of Electronic Packaging, EPEP 2002., 1057919, IEEE Topical Meeting on Electrical Performance of Electronic Packaging, vol. 2002-January, Institute of Electrical and Electronics Engineers Inc., pp. 223-226, 11th Topical Meeting on Electrical Performance of Electronic Packaging, EPEP 2002, Monterey, United States, 10/21/02. https://doi.org/10.1109/EPEP.2002.1057919

Efficient statistical analysis and diagnosis of high speed source synchronous interfaces. / Matoglu, Erdem; Swaminathan, Madhavan; Pham, Nam et al.
Electrical Performance of Electronic Packaging, EPEP 2002. Institute of Electrical and Electronics Engineers Inc., 2002. p. 223-226 1057919 (IEEE Topical Meeting on Electrical Performance of Electronic Packaging; Vol. 2002-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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T1 - Efficient statistical analysis and diagnosis of high speed source synchronous interfaces

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AU - Cases, Moises

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AB - The jitter and voltage margin of a source synchronous memory bus has been analyzed under various physical and operational conditions. Using sensitivity functions derived through linearly independent experiments, the statistical distribution of the performance has been computed. The sensitivity functions have also been utilized as a diagnosis tool to estimate the design parameters required to meet the performance specifications.

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Matoglu E, Swaminathan M, Pham N, De Araujo DN, Cases M. Efficient statistical analysis and diagnosis of high speed source synchronous interfaces. In Electrical Performance of Electronic Packaging, EPEP 2002. Institute of Electrical and Electronics Engineers Inc. 2002. p. 223-226. 1057919. (IEEE Topical Meeting on Electrical Performance of Electronic Packaging). doi: 10.1109/EPEP.2002.1057919

Efficient statistical analysis and diagnosis of high speed source synchronous interfaces

Abstract

Publication series

Conference

All Science Journal Classification (ASJC) codes

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