Abstract
A conflict exists in ultrasonic measurements between the resolution which requires higher frequency, and the penetration depth which requires long wavelength. Traditional pulse-echo method for elastic property measurements fails when the sample becomes too thin to allow the separation of repeated echoes. A data processing technique is described here which may provide a solution to this conflict. Elastic properties were successfully measured in samples as thin as 5% of the wavelength λ.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 355-363 |
| Number of pages | 9 |
| Journal | Ferroelectrics |
| Volume | 206-207 |
| Issue number | 1 -4; 1-2 |
| DOIs | |
| State | Published - 1998 |
| Event | Proceedings of the 1997 Williamsburg Workshop on Ferroelectrics - Williamsburg, VA, USA Duration: Feb 2 1997 → Feb 5 1997 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
Fingerprint
Dive into the research topics of 'Elastic property characterization in thin samples of sub-wavelength in thickness'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver