Abstract
The electrochemical behavior and surface chemistry of sputter‐deposited non‐equilibrium stainless Al–Ta alloys have been investigated. These alloys exhibit enhanced passivity over a pH range of 2–12 even though the passive film chemistry varies considerably over this range. This enhanced passivity can be explained by the solute‐rich interphase mechanism (SRIM), which states that formation and passivation of occluded cells are controlled by localized concentrations of solute. The higher concentrations of solute at the metaloxide interface and around occluded cells stabilize the passive‐film from continued Cl− attack and dissolution.
Original language | English (US) |
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Pages (from-to) | 609-617 |
Number of pages | 9 |
Journal | Surface and Interface Analysis |
Volume | 23 |
Issue number | 9 |
DOIs | |
State | Published - Aug 1995 |
All Science Journal Classification (ASJC) codes
- General Chemistry
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry