Electromagnetic response changes of unidirectional carbon fiber-reinforced polymer circuit-analog absorbers due to post-processing impact damage

Joseph C. O'Donnell, Elliot J. Riley, Ram M. Narayanan

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

This paper explores the effect that impact damage has on the microwave reflection coefficient of unidirectional carbon-fiber reinforced polymer (CFRP) circuit analog absorbers (CAA). Such damage can negatively impact the electromagnetic properties of radar absorbing materials (RAM) and degrade their performance. Three unidirectional CFRP samples comprised of a unidirectional CFRP lamina and foam spacer are fabricated using a wet-layup technique. The samples under test (SUTs) are then individually subject to controlled impact tests. A custom damage apparatus drops and guides a variable weight impactor from a known height towards the center of the SUT. After each damage phase, the complex relative permittivity, surface impedance, and the reflectivity when the samples are placed in an absorber configuration are measured from 4-18 GHz using a free- space measurement system. The change in these properties due to the impact are investigated as a function of frequency, angle, and damage.

Original languageEnglish (US)
Title of host publicationRadar Sensor Technology XXIII
EditorsKenneth I. Ranney, Armin Doerry
PublisherSPIE
ISBN (Electronic)9781510626713
DOIs
StatePublished - 2019
EventRadar Sensor Technology XXIII 2019 - Baltimore, United States
Duration: Apr 15 2019Apr 17 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11003
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceRadar Sensor Technology XXIII 2019
Country/TerritoryUnited States
CityBaltimore
Period4/15/194/17/19

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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