@inproceedings{e4f93f84c25b42b580219cbbaa94c8e0,
title = "Electron traps, structural change, and hydrogen related SIMOX defects",
author = "Conley, {J. F.} and Lenahan, {P. M.} and P. Roitman",
year = "1992",
doi = "10.1109/SOI.1992.664778",
language = "English (US)",
series = "Proceedings - IEEE International SOI Conference",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "26--27",
booktitle = "1992 IEEE International SOI Conference, SOI 1992 - Proceedings",
address = "United States",
note = "1992 IEEE International SOI Conference, SOI 1992 ; Conference date: 06-10-1992 Through 08-10-1992",
}