Abstract
In this paper, a method is presented for compensating of manufacturing defects in a Wollaston prism array (WPA) via post data processing. The manufactured WPA usually suffers from unequal internal wedge angles from sub-prism to sub-prism and the formation of tilted interference fringes within each sub-prism. After compensation, the spectral error induced by defects in the Wollaston prism array is significantly reduced so that the performance of a non-scanning Fourier transform spectrometer can be substantially enhanced. Experimental results are presented to demonstrate the method of compensation.
Original language | English (US) |
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Pages (from-to) | 85-90 |
Number of pages | 6 |
Journal | Optics Communications |
Volume | 238 |
Issue number | 1-3 |
DOIs | |
State | Published - Aug 1 2004 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Physical and Theoretical Chemistry
- Electrical and Electronic Engineering