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Erratum: Depth-resolved ultra-violet spectroscopic photo current-voltage measurements for the analysis of AlGaN/GaN high electron mobility transistor epilayer deposited on Si (applied physics letters 105, 172105 (2014))

  • Burcu Ozden
  • , Chungman Yang
  • , Fei Tong
  • , Min P. Khanal
  • , Vahid Mirkhani
  • , Mobbassar Hassan Sk
  • , Ayayi Claude Ahyi
  • , Minseo Park

Research output: Contribution to journalComment/debatepeer-review

Original languageEnglish (US)
Article number219902
JournalApplied Physics Letters
Volume106
Issue number21
DOIs
StatePublished - May 25 2015

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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