Erratum: Probing domain microstructure in ferroelectric Bi4Ti3O12 thin films by optical second harmonic generation (J. Appl. Phys. (2001) 89 (1387))

Yaniv Barad; James Lettieri; Chris D. Theis; Darrell G. Schlom; Venkatraman Gopalan; J. C. Jiang; X. Q. Pan

doi:10.1063/1.1360714

Erratum: Probing domain microstructure in ferroelectric Bi₄Ti₃O₁₂ thin films by optical second harmonic generation (J. Appl. Phys. (2001) 89 (1387))

Yaniv Barad, James Lettieri, Chris D. Theis, Darrell G. Schlom, Venkatraman Gopalan, J. C. Jiang, X. Q. Pan

Research output: Contribution to journal › Comment/debate › peer-review

Original language	English (US)
Pages (from-to)	5230
Number of pages	1
Journal	Journal of Applied Physics
Volume	89
Issue number	9
DOIs	https://doi.org/10.1063/1.1360714
State	Published - May 1 2001

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.1360714

Cite this

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AU - Schlom, Darrell G.

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AU - Jiang, J. C.

AU - Pan, X. Q.

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Erratum: Probing domain microstructure in ferroelectric Bi4Ti3O12 thin films by optical second harmonic generation (J. Appl. Phys. (2001) 89 (1387))

All Science Journal Classification (ASJC) codes

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Erratum: Probing domain microstructure in ferroelectric Bi₄Ti₃O₁₂ thin films by optical second harmonic generation (J. Appl. Phys. (2001) 89 (1387))