Abstract
For thin film structures acoustically classified as slow-on-fast systems, modeling and evaluation of their interfacial condition are known to be very complex and difficult due to dispersion and multi-mode excitation of acoustic waves. This paper presents a quantitative model and a reliable measurement procedure established for adhesion evaluation of such film structures. An effective interface model employing a virtual intermediate layer is utilized for the dispersion prediction of the surface acoustic wave, which is affected by various interfacial conditions. Through acoustic microscopy experiments, this model presents a potential method to classify the bonding condition. Comparisons with a destructive scratch test and an acoustic imaging verify the failure mode of the film structure.
Original language | English (US) |
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Pages (from-to) | 5786-5795 |
Number of pages | 10 |
Journal | Thin Solid Films |
Volume | 518 |
Issue number | 20 |
DOIs | |
State | Published - Aug 2 2010 |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry