Evaluation of intrinsic and extrinsic contributions to the piezoelectric properties of Pb(Zr1-XTX)O3 thin films as a function of composition

Dong Joo Kim; Jon Paul Maria; Angus I. Kingon; S. K. Streiffer

doi:10.1063/1.1566478

Evaluation of intrinsic and extrinsic contributions to the piezoelectric properties of Pb(Zr_1-XT_X)O₃ thin films as a function of composition

Dong Joo Kim, Jon Paul Maria, Angus I. Kingon, S. K. Streiffer

Materials Science and Engineering

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179 Scopus citations

Abstract

A study was performed on the evaluation of intrinsic and extrinsic contribution to the piezoelectric properties of Pb(Zr_1-xT_x)O₃ thin films. The measurements of the nonlinear behavior and temperature dependence of relative permittivity and piezoelectric coefficients showed that non-180° domain wall motion in these films was negligible. It was found that the extrinsic contribution to the room temperature permittivity was dominated by only 180° domain wall motion.

Original language	English (US)
Pages (from-to)	5568-5575
Number of pages	8
Journal	Journal of Applied Physics
Volume	93
Issue number	9
DOIs	https://doi.org/10.1063/1.1566478
State	Published - May 1 2003

All Science Journal Classification (ASJC) codes

General Physics and Astronomy

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10.1063/1.1566478

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abstract = "A study was performed on the evaluation of intrinsic and extrinsic contribution to the piezoelectric properties of Pb(Zr1-xTx)O3 thin films. The measurements of the nonlinear behavior and temperature dependence of relative permittivity and piezoelectric coefficients showed that non-180° domain wall motion in these films was negligible. It was found that the extrinsic contribution to the room temperature permittivity was dominated by only 180° domain wall motion.",

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AU - Streiffer, S. K.

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AB - A study was performed on the evaluation of intrinsic and extrinsic contribution to the piezoelectric properties of Pb(Zr1-xTx)O3 thin films. The measurements of the nonlinear behavior and temperature dependence of relative permittivity and piezoelectric coefficients showed that non-180° domain wall motion in these films was negligible. It was found that the extrinsic contribution to the room temperature permittivity was dominated by only 180° domain wall motion.

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Evaluation of intrinsic and extrinsic contributions to the piezoelectric properties of Pb(Zr_1-XT_X)O₃ thin films as a function of composition

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